Abstract
A probe correction technique is described for spherical
near-field antenna measurements based on sampling the near
field for three probe orientations in each measurement direction. The technique applies to odd-order probes whose radiated field contains (significant) power only in the first (µ=±1) and thirdorder (µ=±3) azimuthal spherical modes. The technique is ideally suited as an optional probe correction technique for high-accuracy measurements in existing measurement systems that employ a rectangular or square waveguide probe and the traditional first-order probe correction technique.
Original language | English |
---|---|
Journal | IEEE Transactions on Antennas and Propagation |
Volume | 56 |
Issue number | 5 |
Pages (from-to) | 1259-1268 |
ISSN | 0018-926X |
DOIs | |
Publication status | Published - 2008 |
Keywords
- probe correction
- Antenna
- spherical near field
- first-order probe