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A do-it-yourself atomic force microscope using printed circuit board framework

  • Jen Hung Wang
  • , Hsien Shun Liao*
  • , Sebastian Bütefisch
  • , Hans Ulrich Danzebrink
  • , Ing Shouh Hwang
  • , Kuang Yuh Huang
  • , Edwin En Te Hwu*
  • *Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

Abstract

The atomic force microscope (AFM) is a high-resolution instrument that has applications in nanoscience. However, the cost and complexity of an AFM are barriers for people to access this tool. In this study, we design and evaluate a do-it-yourself (DIY) AFM by using low-cost consumer electronic components. In the DIY AFM, a precise scanner and cantilever detection system were realized using disk buzzers and an optical pickup unit, respectively. The mechanical framework with an optional anti-vibration suspension was constructed using printed circuit boards (PCBs), which allows the users to assemble the AFM easily. Experiments verified that the DIY AFM can achieve subnanometer resolution in the vertical direction. The PCB framework supported high-speed scanning at a scan rate of 40 lines s−1 and had a low thermal drift of approximately 6.2

Original languageEnglish
Article number097003
JournalMeasurement Science and Technology
Volume36
Issue number9
Number of pages7
ISSN0957-0233
DOIs
Publication statusPublished - 2025

Keywords

  • Atomic force microscope
  • Do-it-yourself
  • High speed scanning

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