Abstract
We present the design, manufacturing, calibration, and testing of a first-order dual-port conical-horn probe for spherical near-field antenna measurements at 60 GHz. The measurement results demonstrate that the probe performance is acceptable, but they also illustrate the challenges for high accuracy antenna measurements at millimeter-wave frequencies.
| Original language | English |
|---|---|
| Journal | IEEE Antennas and Wireless Propagation Letters |
| Volume | 19 |
| Issue number | 9 |
| Pages (from-to) | 1467 - 1470 |
| ISSN | 1536-1225 |
| DOIs | |
| Publication status | Published - 2020 |
Keywords
- Millimeter-waves
- Antennas measurements
- Near field
- Dual-polarized probe
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