3D -Ray Diffraction Microscopy

Henning Friis Poulsen, Søren Schmidt, Dorte Juul Jensen, Henning Osholm Sørensen, Erik Mejdal Lauridsen, Ulrik Lund Olsen, Wolfgang Ludwig, Andrew King, Jonathan Paul Wright, Gavin B. M. Vaughan

Research output: Chapter in Book/Report/Conference proceedingBook chapterResearchpeer-review


Three-dimensional X-ray diffraction (3DXRD) microscopy is a fast and non-destructive structural characterization technique aimed at the study of individual crystalline elements (grains or subgrains) within mm-sized polycrystalline specimens. It is based on two principles: the use of highly penetrating hard X-rays from a synchrotron source and the application of “tomographic” reconstruction algorithms for the analysis of the diffraction data. In favorable cases, the position, morphology, phase, and crystallographic orientation can be derived for up to a thousand elements simultaneously. For each grain its average strain tensor may also be derived, from which the type-II stresses can be inferred. Furthermore, the dynamics of the individual elements can be monitored during typical processes such as deformation or annealing. Hence, information on the interaction between elements can be obtained directly. In this chapter we first provide an overview of the various experimental approaches for 3DXRD that have emerged. Following this, a more detailed presentation of work related to the classical 3DXRD setup is given. Some emphasis is also placed on the mathematical challenges inherent to the reconstruction of grain and orientation maps.
Original languageEnglish
Title of host publicationStrain and Dislocation Gradients from Diffraction : Spatially-Resolved Local Structure and Defects
EditorsRozaliya Barabash, Gene Ice
PublisherWorld Scientific
Publication date2014
ISBN (Print)978-1-908979-62-9
ISBN (Electronic)978-1-908979-64-3
Publication statusPublished - 2014


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