3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography

Jun Sun, Tianbo Yu, Chaoling Xu, Wolfgang Ludwig, Yubin Zhang*

*Corresponding author for this work

Research output: Contribution to journalJournal articleResearchpeer-review

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Abstract

Synchrotron diffraction contrast tomography (DCT) is for the first time used to characterize recrystallized grains in partially recrystallized Al. The positions, orientations and 3D shapes of >900 recrystallized grains are reconstructed within a gauge volume. The results are compared with those obtained using electron backscattered diffraction based on a statistical analysis. It is found that recrystallized grains with size larger than 10 μm, corresponding to ~98% of the total recrystallized volume of the sample, are well characterized by DCT. The advantages of DCT for recrystallization studies and new possibilities with DCT on new generation synchrotron sources are discussed.
Original languageEnglish
JournalScripta Materialia
Volume157
Pages (from-to)72-75
ISSN1359-6462
DOIs
Publication statusPublished - 2018

Keywords

  • 3D reconstruction
  • Aluminium
  • Electron backscattering diffraction (EBSD)
  • Recrystallization
  • Schwartz-Saltykov analysis

Cite this

@article{509d932648564d7da098c207080f76ef,
title = "3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography",
abstract = "Synchrotron diffraction contrast tomography (DCT) is for the first time used to characterize recrystallized grains in partially recrystallized Al. The positions, orientations and 3D shapes of >900 recrystallized grains are reconstructed within a gauge volume. The results are compared with those obtained using electron backscattered diffraction based on a statistical analysis. It is found that recrystallized grains with size larger than 10 μm, corresponding to ~98{\%} of the total recrystallized volume of the sample, are well characterized by DCT. The advantages of DCT for recrystallization studies and new possibilities with DCT on new generation synchrotron sources are discussed.",
keywords = "3D reconstruction, Aluminium, Electron backscattering diffraction (EBSD), Recrystallization, Schwartz-Saltykov analysis",
author = "Jun Sun and Tianbo Yu and Chaoling Xu and Wolfgang Ludwig and Yubin Zhang",
year = "2018",
doi = "10.1016/j.scriptamat.2018.08.001",
language = "English",
volume = "157",
pages = "72--75",
journal = "Scripta Materialia",
issn = "1359-6462",
publisher = "Pergamon Press",

}

3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography. / Sun, Jun; Yu, Tianbo; Xu, Chaoling; Ludwig, Wolfgang; Zhang, Yubin.

In: Scripta Materialia, Vol. 157, 2018, p. 72-75.

Research output: Contribution to journalJournal articleResearchpeer-review

TY - JOUR

T1 - 3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography

AU - Sun, Jun

AU - Yu, Tianbo

AU - Xu, Chaoling

AU - Ludwig, Wolfgang

AU - Zhang, Yubin

PY - 2018

Y1 - 2018

N2 - Synchrotron diffraction contrast tomography (DCT) is for the first time used to characterize recrystallized grains in partially recrystallized Al. The positions, orientations and 3D shapes of >900 recrystallized grains are reconstructed within a gauge volume. The results are compared with those obtained using electron backscattered diffraction based on a statistical analysis. It is found that recrystallized grains with size larger than 10 μm, corresponding to ~98% of the total recrystallized volume of the sample, are well characterized by DCT. The advantages of DCT for recrystallization studies and new possibilities with DCT on new generation synchrotron sources are discussed.

AB - Synchrotron diffraction contrast tomography (DCT) is for the first time used to characterize recrystallized grains in partially recrystallized Al. The positions, orientations and 3D shapes of >900 recrystallized grains are reconstructed within a gauge volume. The results are compared with those obtained using electron backscattered diffraction based on a statistical analysis. It is found that recrystallized grains with size larger than 10 μm, corresponding to ~98% of the total recrystallized volume of the sample, are well characterized by DCT. The advantages of DCT for recrystallization studies and new possibilities with DCT on new generation synchrotron sources are discussed.

KW - 3D reconstruction

KW - Aluminium

KW - Electron backscattering diffraction (EBSD)

KW - Recrystallization

KW - Schwartz-Saltykov analysis

U2 - 10.1016/j.scriptamat.2018.08.001

DO - 10.1016/j.scriptamat.2018.08.001

M3 - Journal article

VL - 157

SP - 72

EP - 75

JO - Scripta Materialia

JF - Scripta Materialia

SN - 1359-6462

ER -