Abstract
Understanding the distributions of strain within solid bodies undergoing plastic deformation has been of interest for many years in a wide range of disciplines, ranging from basic materials science to biology. However, the desire to investigate these strain fields has been frustrated by the inaccessibility of the interior of most samples to detailed investigation without destroying the sample in the process. Over the last decade, this situation has changed by the introduction of a range of tomographic methods based both on advances in computer technology and in instrumentation, advances which have opened up the interior of optically opaque samples for detailed investigations. We present a general method for assessing the strain in the interior of marker-containing specimens undergoing various types of deformation. The results are compared with Finite Element modelling.
Original language | English |
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Title of host publication | Developments in X-Ray Tomography V |
Editors | Ulrich Bonse |
Number of pages | 10 |
Volume | 6318 |
Publisher | SPIE - International Society for Optical Engineering |
Publication date | 2006 |
Article number | 63181B |
DOIs | |
Publication status | Published - 2006 |
Event | SPIE Optics and Photonics 2006: Plasmonics: Nanoimaging, Nanofabrication, and their Applications II - San Diego, CA, United States Duration: 13 Aug 2006 → 17 Aug 2006 Conference number: 6324 |
Conference
Conference | SPIE Optics and Photonics 2006 |
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Number | 6324 |
Country/Territory | United States |
City | San Diego, CA |
Period | 13/08/2006 → 17/08/2006 |
Series | Proceedings of SPIE - The International Society for Optical Engineering |
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ISSN | 0277-786X |
Keywords
- Tomography
- Strain measurement
- Bulk
- Non-destructive
- Finite element