1/f Noise Characterization in CMOS Transistors in 0.13um Technology

Jelena Haas-Christensen, Lars J. Stenberg, Pietro Andreani

Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 24st Norchip Conference
Publication date	2006
Pages	81-84
Publication status	Published - 2006
Event	2006 IEEE 24th NORCHIP Conference - Linköping, Sweden Duration: 20 Nov 2006 → 21 Nov 2006 Conference number: 24 https://ieeexplore.ieee.org/xpl/conhome/4126933/proceeding

Conference	2006 IEEE 24th NORCHIP Conference
Number	24
Country/Territory	Sweden
City	Linköping
Period	20/11/2006 → 21/11/2006
Internet address	https://ieeexplore.ieee.org/xpl/conhome/4126933/proceeding

OpenUrl availability

@inproceedings{4383ae4c2d1a4cf0a29bbb646dcf885f,

title = "1/f Noise Characterization in CMOS Transistors in 0.13um Technology",

author = "Jelena Haas-Christensen and Stenberg, {Lars J.} and Pietro Andreani",

year = "2006",

language = "English",

pages = "81--84",

booktitle = "Proceedings of the 24st Norchip Conference",

note = "2006 IEEE 24th NORCHIP Conference ; Conference date: 20-11-2006 Through 21-11-2006",

url = "https://ieeexplore.ieee.org/xpl/conhome/4126933/proceeding",

}

TY - GEN

T1 - 1/f Noise Characterization in CMOS Transistors in 0.13um Technology

AU - Haas-Christensen, Jelena

AU - Stenberg, Lars J.

AU - Andreani, Pietro

N1 - Conference code: 24

PY - 2006

Y1 - 2006

M3 - Article in proceedings

SP - 81

EP - 84

BT - Proceedings of the 24st Norchip Conference

T2 - 2006 IEEE 24th NORCHIP Conference

Y2 - 20 November 2006 through 21 November 2006

ER -