1/f Noise Characterization in CMOS Transistors in 0.13um Technology

Jelena Haas-Christensen, Lars J. Stenberg, Pietro Andreani

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

Original languageEnglish
Title of host publicationProceedings of the 24st Norchip Conference
Publication date2006
Pages81-84
Publication statusPublished - 2006
Event24th Norchip Conference - Linköping, Sweden
Duration: 20 Nov 200621 Nov 2006
Conference number: 24

Conference

Conference24th Norchip Conference
Number24
CountrySweden
CityLinköping
Period20/11/200621/11/2006

Cite this

Haas-Christensen, J., Stenberg, L. J., & Andreani, P. (2006). 1/f Noise Characterization in CMOS Transistors in 0.13um Technology. In Proceedings of the 24st Norchip Conference (pp. 81-84)