Optimal Correction of Scanning Probe Microscopy Images.

    Project Details


    The project concerns improvement of calibration and correct images from a
    Scanning Probe Microscope (SPM). The SPM consists of a piezo tube on which the
    sample is mounted. The tube moves the
    sample underneath an ultrafine tip. The
    vertical movement of the tip is
    registered by a laser beam during
    scanning across the sample surface in
    either contact mode or tapping mode.
    From the vertical movement of the tip
    an image of the sample surface is
    The goal is to provide a better
    understanding of the movement and control
    of SPMs through mathematical modelling
    and to investigate the tip-sample
    interaction and its influence
    on the scanned image.
    Effective start/end date01/08/199731/07/2000


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