Optimal Correction of Scanning Probe Microscopy Images.

The project concerns improvement of calibration and correct images from a
Scanning Probe Microscope (SPM). The SPM consists of a piezo tube on which the
sample is mounted. The tube moves the
sample underneath an ultrafine tip. The
vertical movement of the tip is
registered by a laser beam during
scanning across the sample surface in
either contact mode or tapping mode.
From the vertical movement of the tip
an image of the sample surface is
recorded.
The goal is to provide a better
understanding of the movement and control
of SPMs through mathematical modelling
and to investigate the tip-sample
interaction and its influence
on the scanned image.