Optical Methods for Characterization of Surface or Interface Structures on a Nanometer Scale

  • Gregersen, Niels (PhD Student)
  • Mork, Jesper (Main Supervisor)
  • Garnæs, Jørgen (Supervisor)
  • Hanson, Steen Grüner (Supervisor)
  • Tromborg, Bjarne (Supervisor)
  • Lægsgaard, Jesper (Examiner)
  • Bienstman, Peter (Examiner)
  • Vohnsen, Brian (Examiner)

Project Details

Effective start/end date01/11/200330/03/2007


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