Advanced Characterization of Semiconductors using Microprobes

Petersen, Dirch Hjorth (PhD Student)
Bøggild, Peter (Main Supervisor)
Nielsen, Peter Folmer (Supervisor)
Vandervorst, Wilfried (Supervisor)
Thomsen, Erik Vilain (Examiner)
Hofmann, Philip (Examiner)
Koon, Daniel W. (Examiner)
Hansen, Ole (Supervisor)

Status	Finished
Effective start/end date	15/12/2006 → 20/01/2010

Funding

DTU, Samfinansiering

2 Ph.D. thesis

Advanced Characterization of Semiconductors using Microprobes
Petersen, D. H., Jan 2010, Kgs. Lyngby, Denmark: Technical University of Denmark.
Research output: Book/Report › Ph.D. thesis
Micro Four-Point Probe and Micro Hall Effect: Methods for Reliable Electrical Characterization of Ultra-Shallow Junctions
Petersen, D. H., 2009, Technical University of Denmark. 64 p.
Research output: Book/Report › Ph.D. thesis

Open Access
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