Advanced Characterization of Semiconductors using Microprobes

  • Petersen, Dirch Hjorth (PhD Student)
  • Bøggild, Peter (Main Supervisor)
  • Nielsen, Peter Folmer (Supervisor)
  • Vandervorst, Wilfried (Supervisor)
  • Thomsen, Erik Vilain (Examiner)
  • Hofmann, Philip (Examiner)
  • Koon, Daniel W. (Examiner)
  • Hansen, Ole (Supervisor)

    Project Details

    StatusFinished
    Effective start/end date15/12/200620/01/2010

    Funding

    • DTU, Samfinansiering