Advanced Characterization of Semiconductors using Microprobes

Petersen, Dirch Hjorth (PhD Student)
Bøggild, Peter (Main Supervisor)
Nielsen, Peter Folmer, (Supervisor)
Vandervorst, Wilfried (Supervisor)
Thomsen, Erik Vilain (Examiner)
Hofmann, Philip (Examiner)
Koon, Daniel W. (Examiner)
Hansen, Ole (Supervisor)

Project Details

Status	Finished
Effective start/end date	15/12/2006 → 20/01/2010

Research Output

2 Ph.D. thesis

Advanced Characterization of Semiconductors using Microprobes

Petersen, D. H., Jan 2010, Kgs. Lyngby, Denmark: Technical University of Denmark.

Research output: Book/Report › Ph.D. thesis

Micro Four-Point Probe and Micro Hall Effect: Methods for Reliable Electrical Characterization of Ultra-Shallow Junctions

Petersen, D. H., 2009, Technical University of Denmark. 64 p.

Research output: Book/Report › Ph.D. thesis

Open Access

File