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Research Output

  • 1 Article in proceedings

Wafer Level Characterization of Row-Column Addressed CMUT Arrays

Thomsen, E. V., Steenberg, K., Petersen, M. G., Weile, M. A., Havreland, A. S., Ommen, M. L., Grass, R. S. & Engholm, M., 2019, Proceedings of 2019 IEEE International Ultrasonics Symposium. IEEE, p. 770-773

Research output: Chapter in Book/Report/Conference proceedingArticle in proceedingsResearchpeer-review

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