Engineering & Materials Science
X rays
100%
Lenses
95%
Reactive ion etching
65%
Silicon
65%
Aspect ratio
54%
Atomic layer deposition
35%
Optics
32%
Ions
32%
Etching
31%
Microscopic examination
30%
Atomic force microscopy
29%
Synchrotron radiation
29%
Photons
24%
Molding
23%
Aluminum oxide
22%
Fabrication
20%
Silicon wafers
19%
Full width at half maximum
18%
Lithography
17%
Microstructure
15%
Polydimethylsiloxane
14%
Surface defects
14%
Wet etching
10%
Casting
10%
Statistical methods
9%
Electroplating
9%
Silicon compounds
8%
Polyethylenes
8%
Photoelectron spectroscopy
8%
Optical testing
7%
Injection molding
7%
Nickel
7%
Materials science
7%
Coatings
7%
Inductively coupled plasma
6%
Oxidation
6%
Ion beams
6%
Bending (forming)
6%
Aberrations
6%
Nanostructures
5%
Polymers
5%
Metamaterials
5%
Substrates
5%
Diffraction
5%
Physics & Astronomy
high aspect ratio
58%
silicon
53%
etching
50%
lenses
37%
kinoform
35%
atomic layer epitaxy
27%
lithography
26%
replicas
24%
ions
24%
x rays
24%
gratings
19%
wafers
19%
fabrication
18%
atomic force microscopy
17%
curvature
17%
electron beams
16%
damage
16%
microscopy
16%
radii
14%
optics
14%
microstructure
13%
cavities
12%
polymers
10%
injection molding
9%
reflectance
9%
passivity
9%
life (durability)
9%
energy
8%
templates
8%
surface defects
8%
profiles
8%
statistical analysis
8%
nonuniformity
7%
trapping
7%
optimization
7%
synchrotron radiation
6%
ion beams
6%
numerical aperture
6%
materials science
6%
coatings
6%
silicon compounds
6%
insulators
5%
oxidation
5%
Chemical Compounds
Etching
50%
Shape
30%
Atomic Layer Epitaxy
27%
Synchrotron Radiation
20%
Ion
20%
Energy
20%
X-Ray
18%
Photon
18%
Atomic Force Microscopy
18%
Silicon Molecular Entity
16%
Length
11%
Surface Defect
9%
Transmittance
7%
Casting
7%
Electrodeposition
6%
Coating Agent
5%
Ion Beam
5%
