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Jørgen Schou

  • Frederiksborgvej 399, 130, 147

    DK-4000 Roskilde


1978 …2022
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Research Output 1978 2020


Secondary electron spectra from charged particle interactions

Rudd, M. E., Kim, Y-K., Märk, T., Schou, J., Stolterfoht, N. & Toburen, L. H., 1996, Bethesda, MD: International Commission on Radiation Units and Measurements. 108 p. (ICRU-55).

Research output: Book/ReportBookResearchpeer-review


Fundamental electron and ion beam interactions with solids for microscopy, microanalysis and microlithography

Schou, J., Kruit, P. & Newbury, D. E., 1991, Chicago, IL: Scanning Microscopy International. 370 p. (Scanning Microscopy Supplement, 4).

Research output: Book/ReportBookResearchpeer-review