Research output per year
Research output per year
Fingerprint
Dive into the research topics where Dirch Hjorth Petersen is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Network
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
Research output
-
Determination of thermal diffusivity of thermoelectric materials using a micro four-point probe method
Beltrán-Pitarch, B., Guralnik, B., Lamba, N., Stilling-Andersen, A. R., Nørregaard, L., Hansen, T. M., Hansen, O., Pryds, N., Nielsen, P. F. & Petersen, D. H., 2023, In: Materials Today Physics. 31, 7 p., 100963.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile2 Downloads (Pure) -
Determination of thermoelectric properties from micro four-point probe measurements
Guralnik, B., Hansen, O., Stilling-Andersen, A. R., Hansen, S. E., Borup, K. A., Mihiretie, B. M., Beltrán-Pitarch, B., Henrichsen, H. H., Lin, R., Shiv, L., Iversen, B. B., Nielsen, P. F. & Petersen, D. H., 2022, In: Measurement Science and Technology. 33, 12, 12 p., 125001.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile31 Downloads (Pure) -
Review of Micro- and Nanoprobe Metrology for Direct Electrical Measurements on Product Wafers
Guralnik, B., Nielsen, P. F., Petersen, D. H., Hansen, O., Shiv, L., Wei, W., Marangoni, T. A., Buron, J. D., Osterberg, F. W., Lin, R., Henrichsen, H. H. & Hansen, M. F., 2022, Proceedings of 2022 China Semiconductor Technology International Conference (CSTIC). IEEE, 4 p. (2022 China Semiconductor Technology International Conference (cstic)).Research output: Chapter in Book/Report/Conference proceeding › Conference abstract in proceedings › Research › peer-review
-
3ω correction method for eliminating resistance measurement error due to Joule heating
Guralnik, B., Hansen, O., Henrichsen, H. H., Beltrán-Pitarch, B., Østerberg, F. W., Shiv, L., Marangoni, T. A., Stilling-Andersen, A. R., Cagliani, A., Hansen, M. F., Nielsen, P. F., Oprins, H., Vermeersch, B., Adelmann, C., Dutta, S., Borup, K. A., Mihiretie, B. M. & Petersen, D. H., 2021, In: Review of Scientific Instruments. 92, 9, 6 p., 094711.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile61 Downloads (Pure) -
Apparent size effects on dopant activation in nanometer-wide Si fins
Folkersma, S., Bogdanowicz, J., Favia, P., Wouters, L., Petersen, D. H., Hansen, O., Henrichsen, H. H., Nielsen, P. F., Shiv, L. & Vandervorst, W., 2021, In: Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures. 39, 2, 023202.Research output: Contribution to journal › Journal article › Research › peer-review
Open AccessFile12 Downloads (Pure)
-
Microscale thermoelectric materials characterization
Rani, N., Petersen, D. H. & Pryds, N.
01/12/2020 → 30/11/2023
Project: PhD
-
Modelling of nanoscale heat and charge transport
Rosendal, V., Petersen, D. H., Brandbyge, M. & Pryds, N.
01/10/2020 → 30/09/2023
Project: PhD
-
Investigation of the temperature coefficient of resistance in ultra-thin metal fims
Marangoni, T., Petersen, D. H., Hansen, O., Guralnik, B., Bøggild, P., Koon, D. & Tegenkamp, C.
01/12/2018 → 09/05/2022
Project: PhD
-
Metrology for electrical characterization of advanced materials
Kalhauge, K. G., Petersen, D. H., Jepsen, P. U., Hansen, O., Jensen, J. S., Rosenwaks, Y. & de Oliveria Hansen, R. M.
15/10/2016 → 11/03/2020
Project: PhD
-
Micro four-point probe based metrology
Witthøft, M., Petersen, D. H., Keller, S. S., Boero, G., Tegenkamp, C. & Hansen, O.
01/05/2016 → 13/11/2019
Project: PhD
-
17th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP09
Dirch Hjorth Petersen (Participant)
29 Sep 2009 → 2 Oct 2009Activity: Attending an event › Participating in or organising a conference
-
Talk about "Photo-voltage versus micro-probe sheet resistance measurements on ultra-shallow structures" at INSIGHT 2009
Dirch Hjorth Petersen (Speaker)
30 May 2009Activity: Talks and presentations › Conference presentations
-
17th International Conference on Advanced Thermal Processing of Semiconductors RTP09
Dirch Hjorth Petersen (Participant)
29 Sep 2009 → 2 Oct 2009Activity: Attending an event › Participating in or organising a conference
-
Talk about "Review of electrical characterization of ultra-shallow junctions with micro four-point probes" at INSIGHT 2009, San Francisco, US
Dirch Hjorth Petersen (Speaker)
30 May 2009Activity: Talks and presentations › Conference presentations
-
17th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP09
Dirch Hjorth Petersen (Participant)
29 Sep 2009 → 2 Oct 2009Activity: Attending an event › Participating in or organising a conference