Alice Bastos da Silva Fanta

Alice Bastos da Silva Fanta

Researcher

Fysikvej

Building: 307, 112

2800 Kgs. Lyngby

Denmark

Responsible for (assisted by Anne Marie Rasmussen) Cen’s Helios dual-beam FIB, for the development and application of techniques based on electron backscatter diffraction, for training new users, and providing assistance in the FIB preparation of TEM specimens. Her research interests include the characterization of electrodeposited materials and steels.

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  • Surface and Coatings Technology

    ISSNs: 0257-8972

    Elsevier S.A., Switzerland

    BFI (2019): BFI-level 1, Scopus rating (2018): CiteScore 3.44 SJR 0.973 SNIP 1.435, Web of Science (2019): Indexed yes, ISI indexed (2013): ISI indexed yes

    Central database

    Journal

  • Ultramicroscopy

    ISSNs: 0304-3991

    Elsevier B.V., Netherlands

    BFI (2019): BFI-level 1, Scopus rating (2018): CiteScore 2.72 SJR 1.556 SNIP 1.217, Web of Science (2019): Indexed yes, ISI indexed (2013): ISI indexed yes

    Central database

    Journal

  • Journal of Microscopy

    ISSNs: 0022-2720

    Additional searchable ISSN (Electronic): 1365-2818

    Wiley-Blackwell, United Kingdom

    BFI (2019): BFI-level 1, Scopus rating (2018): CiteScore 1.89 SJR 0.678 SNIP 0.838, Web of Science (2019): Indexed yes, ISI indexed (2013): ISI indexed yes

    Central database

    Journal

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ID: 44904