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2019

A magnetometer using optically active defects in a solid state material

Huck, A., Ahmadi, S., El-Ella, H. & Andersen, U. L., 2019, IPC No. G01R33/323 , Patent No. WO2019002576, 3 Jan 2019, Priority date 29 Jun 2017, Priority No. EP20170178726

Research output: Patent

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