Microstructural Analysis of materials Processes in the SEM

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2021
Recent developments for the characterization of crystals and defects at the nanoscale using on-axis TKD in SEM
Goran, D., Schwager, T. & DaSilva Fanta, A. B., 2021, ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis. ASM International, Vol. 2021. p. 217-223 istfa2021p0217
Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review

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