Microelectronics Reliability

ISSNs: 0026-2714

Additional searchable ISSN (Electronic): 1872-941X

Pergamon Press, United Kingdom

BFI (2020): BFI-level 1, Scopus rating (2018): CiteScore 1.7 SJR 0.376 SNIP 0.983, Web of Science (2020): Indexed yes, ISI indexed (2013): ISI indexed yes

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ID: 124108

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