The Focused Ion Beam – Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging

Bowen, J. R. (Guest lecturer)

Activity: Talks and presentationsGuest lectures, external teaching and course activities at other universities

Description

Remote teaching guest lecture (2 hours) as part of The Univerity of Connecticut course: ME3295/5895 Three Dimensional Imaging of Materials

Guest lecturer

Slides available on request
Period13 Oct 2014
Held atUniversity of Connecticut, United States

Keywords

  • Teaching
  • Focused ion beam
  • Microstructure
  • 3D reconstruction