The Focused Ion Beam – Scanning Electron Microscope: A tool for sample preparation, two and three dimensional imaging

Activity: Talks and presentationsGuest lectures, external teaching and course activities at other universities

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Jacob R. Bowen - Guest lecturer

Remote teaching guest lecture (2 hours) as part of The Univerity of Connecticut course: ME3295/5895 Three Dimensional Imaging of Materials

Guest lecturer

Slides available on request
13 Oct 2014

External organisation (Academic)

NameUniversity of Connecticut

    Keywords

  • Teaching, Focused ion beam, Microstructure, 3D reconstruction
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ID: 137680483