Monitoring strain path changes by high resolution reciprocal space mapping

Pantleon, W. (Invited speaker)

Activity: Talks and presentationsConference presentations

Description

The evolution of deformation structures in polycrystalline copper during strain
path changes is observed in situ by high resolution reciprocal space mapping
with high energy synchrotron radiation. The resolved behavior of a large number
of resolved individual subgrains (complemented by conventional x-ray peak profile analysis) allows a distinction between two different regimes during the
mechanically transient behavior following the strain path change: below about
0.3% strain, number and orientation of the resolved subgrains changes only slightly while their elastic stresses are significantly altered indicating a
microplastic regime during which only the subgrains deform plastically and no
yielding occurs in dislocation walls. After reloading to about 0.3% strain, the
elastic stresses of the individual subgrains (having reached the corresponding
values of unidirectionally deformed reference specimens) increase only slightly
further on - accompanied by occasional appearances of new subgrains, abundant
orientation changes and removal of individual existing subgrains.
Period11 Mar 201215 Mar 2012
Event title141st TMS Annual Meeting and Exhibition: Linking Science and Technology for Global Solutions
Event typeConference
Conference number141
LocationOrlando, United States, Florida