Skip to main navigation Skip to search Skip to main content

Mid-infrared OCT imaging in highly scattering samples using real-time upconversion of broadband supercontinuum covering from 3.6-4.6 μm

Activity: Talks and presentationsConference presentations

Period2 Feb 20197 Feb 2019
Event titleSPIE Photonics West BiOS 2019
Event typeConference
SponsorsSENO Medical Instruments, Inc., SPIE
LocationSan Francisco, United States, CaliforniaShow on map
Degree of RecognitionInternational