Description
Precision of Micro Hall Effect Measurements in Scribe Line Test Pads of B-doped SiPeriod | 21 Mar 2017 → 23 Mar 2017 |
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Event type | Conference |
Location | Monterey, CA, United StatesShow on map |
Degree of Recognition | International |
Documents & Links
Related content
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Publications
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Precision of Micro Hall Effect Measurements in Scribe Line Test Pads
Research output: Contribution to conference › Conference abstract for conference › Research › peer-review
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Precision of Micro Hall Effect Measurements in Scribe Line Test Pads of B-doped SiGe
Research output: Contribution to conference › Poster › Research › peer-review