International Conference on Frontiers of Characterization and Metrology for Nanoelectronics 2017

Maria-Louise Witthøft (Participant)

    Activity: Attending an eventParticipating in or organising a conference

    Description

    Precision of Micro Hall Effect Measurements in Scribe Line Test Pads of B-doped Si
    Period21 Mar 201723 Mar 2017
    Event typeConference
    LocationMonterey, CA, United States
    Degree of RecognitionInternational