IEEE-NEMS 2008

Meng Tang (Participant)

    Activity: Attending an eventParticipating in or organising a conference

    Description

    Au Nanoparticle Detection using Silicon Micro/Nano mechanical devices with Integrated Strain Gauge Readout

    Place: IEEE NEMS 2008. Sanya, China
    Period6 Jan 20089 Jan 2008
    Event typeConference
    Conference number3
    LocationSanya, China
    Degree of RecognitionInternational