Four-Point Probe Measurements on Inhomogeneouse Samples: A probe spacing Dependence Study, Proceedings of the 17the IEEE International Conference on Advanced Thermal Processing of Semiconductors, RTP 2009

Frederik Westergaard Østerberg (Speaker)

    Activity: Talks and presentationsConference presentations

    Description

    Place: New York
    Period29 Sep 20092 Oct 2009
    Held atUnknown