EUSPEN Micro/Nano Manufacturing Workshop

Activity: Talks and presentationsConference presentations

Description

Metrological investigation of nanostructured polymer surfaces replication using atomic force microscopy

Oral Session: Metrology & Quality Control for Microparts II
Period25 Nov 2015
Event titleEUSPEN Micro/Nano Manufacturing Workshop
Event typeWorkshop
LocationTeddington, United Kingdom

Keywords

  • Metrological investigation, polymer surfaces replication, atomic force microscopy, AFM