3rd Conference on Frontiers of Aberration Corrected Electron Microscopy

  • Fabrizio Gualandris (Speaker)

Activity: Talks and presentations › Conference presentations

Description

Poster presentation at PICO conference 2015
Period19 Apr 2015 → 23 Apr 2015
Event title3rd Conference on Frontiers of Aberration Corrected Electron Microscopy
Event typeConference
Conference number3
LocationKasteel Vaalsbroek, NetherlandsShow on map
Degree of RecognitionInternational

Keywords

  • In Situ TEM, SOFC, LSC

Documents & Links

  • Abstract

    File: application/pdf, 143 KB

    Type: Text file