2008 3rd IEEE International Conference on Nano/Micro Engineered and Molecular Systems

Boisen, A. (Participant)

    Activity: Attending an eventParticipating in or organising a conference

    Description

    Au Nanoparticle Detection using Silicon Micro/Nano mechanical devices with Intergrated Strain Gauge Readout

    Place: IEEE NEMS 2008. Sanya, China
    Period1 Jan 2008 → …
    Event typeConference
    Conference number3
    LocationSanya, China
    Degree of RecognitionInternational