17th IEEE International Conference on Advanced Thermal Processing of Semiconductors RTP09

Petersen, D. H. (Participant)

    Activity: Attending an eventParticipating in or organising a conference

    Description

    Accurate micro Hall Effect measurements on scribe line pads.
    Period29 Sep 20092 Oct 2009
    Event typeConference
    Conference number17
    LocationAlbany, United States, New York