Cellular scanning strategy for selective laser melting: Generating reliable, optimized scanning paths and processing parameters

Research output: Research - peer-reviewArticle in proceedings – Annual report year: 2015

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Selective laser melting is yet to become a standardized industrial manufacturing technique. The process continues to suffer from defects such as distortions, residual stresses, localized deformations and warpage caused primarily due to the localized heating, rapid cooling and high temperature gradients that occur during the process. While process monitoring and control of selective laser melting is an active area of research, establishing the reliability and robustness of the process still remains a challenge.In this paper, a methodology for generating reliable, optimized scanning paths and process parameters for selective laser melting of a standard sample is introduced. The processing of the sample is simulated by sequentially coupling a calibrated 3D pseudo-analytical thermal model with a 3D finite element mechanical model.The optimized processing parameters are subjected to a Monte Carlo method based uncertainty and reliability analysis. The reliability of the scanning paths are established using cumulative probability distribution functions for process output criteria such as sample density, thermal homogeneity, etc. A customized genetic algorithm is used along with the simulation model to generate optimized cellular scanning strategies and processing parameters, with an objective of reducing thermal asymmetries and mechanical deformations. The optimized scanning strategies are used for selective laser melting of the standard samples, and experimental and numerical results are compared.
Original languageEnglish
Title of host publicationProceedings of SPIE : Laser 3D Manufacturing II
EditorsHenry Helvajian, Alberto Piqué, Martin Wegener, Bo Gu
Number of pages13
Volume9353
PublisherSPIE - International Society for Optical Engineering
Publication date2015
Article number93530U
ISBN (Print)9781628414431
DOIs
StatePublished - 2015
SeriesProceedings of SPIE, the International Society for Optical Engineering
Volume9353
ISSN0277-786X

Bibliographical note

Copyright 2015 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

CitationsWeb of Science® Times Cited: 1

    Research areas

  • SLM, Scan strategies, Optimized scan strategies, Pseudo-analytical modeling, Thermo-mechanical analysis, Reliability estimation
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