X-ray diffraction study of directionally grown perylene crystallites

Publication: Research - peer-reviewJournal article – Annual report year: 2008

View graph of relations

Using grazing incidence X-ray diffraction, perylene crystallites grown on thin highly oriented poly(tetrafluoroethylene) (PTFE) films on silicon substrates have been investigated. All the perylene crystallites are found to orient with the ab plane of the monoclinic unit cell parallel to the substrate. The scattering data is interpreted as a trimodal texture of oriented perylene crystallites, induced by interactions between the perylene molecules and the oriented PTFE substrate. Three families of biaxial orientations are seen, with the <h10 > axes (h = 1, 2, or 3) parallel to the PTFE alignment, all having the ab-plane parallel to the substrate. About 92% of the scattered intensity corresponds to a population with <110 > highly parallel to <001 >(PTFE).
Original languageEnglish
JournalJournal of Physical Chemistry Part C: Nanomaterials and Interfaces
Publication date2008
Volume112
Issue12
Pages4569-4572
ISSN1932-7447
DOIs
StatePublished
CitationsWeb of Science® Times Cited: 3
Download as:
Download as PDF
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
PDF
Download as HTML
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
HTML
Download as Word
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
Word

ID: 6257693