Virtual subpixel approach for single-mask phase-contrast imaging using Timepix3

Research output: Contribution to journalConference article – Annual report year: 2019Researchpeer-review

View graph of relations

X-ray phase contrast imaging provides a method to distinguish materials with similar density and effective atomic number, which otherwise would be difficult using conventional X-ray absorption contrast. In recent years, multiple methods have been developed to acquire X-ray phase contrast images using incoherent laboratory sources. The single mask edge illumination setup has been demonstrated as a possible candidate for large scale applications due to its relaxed restrictions on longitudinal coherence and mask alignment, and for its ability to do bi-directional phase contrast images in a single sample exposure. Unfortunately, the single mask edge illumination setup’s refraction sensitivity, and thereby signal to noise, is limited by detector artifacts. Furthermore, it requires multiple exposures to perform dark-field imaging, a method that enables imaging of micro-structures smaller than the image resolution.
Original languageEnglish
Article numberC01011
JournalJournal of Instrumentation
Volume14
Issue number01
Number of pages9
ISSN1748-0221
DOIs
Publication statusPublished - 2019
Event20th International Workshop on Radiation Imaging Detectors - Sundsvall, Sweden
Duration: 24 Jun 201828 Jun 2018
Conference number: 20

Conference

Conference20th International Workshop on Radiation Imaging Detectors
Number20
CountrySweden
CitySundsvall
Period24/06/201828/06/2018
CitationsWeb of Science® Times Cited: No match on DOI
Download as:
Download as PDF
Select render style:
APAAuthorCBE/CSEHarvardMLAStandardVancouverShortLong
PDF
Download as HTML
Select render style:
APAAuthorCBE/CSEHarvardMLAStandardVancouverShortLong
HTML
Download as Word
Select render style:
APAAuthorCBE/CSEHarvardMLAStandardVancouverShortLong
Word

ID: 165856774