Tracking: A method for structural characterization of grains in powders or polycrystals - DTU Orbit

‹ Back to search result

Tracking: A method for structural characterization of grains in powders or polycrystals

Publication: Research - peer-review › Journal article – Annual report year: 2001

DOI

10.1107/S0021889801014170

By the same authors

Combining x-ray diffraction contrast tomography and mesoscale grain growth simulations in strontium titanate: An integrated approach for the investigation of microstructure evolution
Publication: Research - peer-review › Article in proceedings – Annual report year: 2013
In Situ Observation of the Dislocation Structure Evolution During a Strain Path Change in Copper
Publication: Research - peer-review › Journal article – Annual report year: 2013
Three-dimensional simulations of microstructural evolution in polycrystalline dual-phase materials with constant volume fractions
Publication: Research - peer-review › Journal article – Annual report year: 2013
An introduction to three-dimensional X-ray diffraction microscopy
Publication: Research - peer-review › Journal article – Annual report year: 2012
Box-scan: A novel 3DXRD method for studies of recrystallization and grain growth
Publication: Research - peer-review › Conference abstract in journal – Annual report year: 2012

Author: Lauridsen, E.M.
Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399, 4000, Roskilde
Email:
Author: Schmidt, Søren
Risø National Laboratory for Sustainable Energy, Technical University of Denmark
Email:
Author: Suter, R.M.
Author: Poulsen, H.F.
Risø National Laboratory for Sustainable Energy, Technical University of Denmark, Frederiksborgvej 399, 4000, Roskilde
Email:

View graph of relations

Original language	English
Journal	J. Appl. Cryst.
Publication date	2001
Volume	34
Pages	744-750
DOIs	http://dx.doi.org/10.1107/S0021889801014170
State	Published

Citations	Web of Science® Times Cited: 90

ID: 6544954