Three-Dimensional Orientation Mapping in the Transmission Electron Microscope

Publication: Research - peer-reviewJournal article – Annual report year: 2011

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Over the past decade, efforts have been made to develop nondestructive techniques for three-dimensional (3D) grain-orientation mapping in crystalline materials. 3D x-ray diffraction microscopy and differential-aperture x-ray microscopy can now be used to generate 3D orientation maps with a spatial resolution of 200 nanometers (nm). We describe here a nondestructive technique that enables 3D orientation mapping in the transmission electron microscope of mono- and multiphase nanocrystalline materials with a spatial resolution reaching 1 nm. We demonstrate the technique by an experimental study of a nanocrystalline aluminum sample and use simulations to validate the principles involved
Original languageEnglish
JournalScience
Volume332
Issue number6031
Pages (from-to)833-834
ISSN0036-8075
DOIs
StatePublished - 2011
Peer-reviewedYes
CitationsWeb of Science® Times Cited: 39

Keywords

  • Materials characterisation and modelling
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