Three-dimensional grain mapping by x-ray diffraction contrast tomography and the use of Friedel pairs in diffraction data analysis
Publication: Research - peer-review › Journal article – Annual report year: 2009
|Journal||Review of Scientific Instruments|
|State||Published - 2009|
Copyright (2009) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
|Citations||Web of Science® Times Cited: 65|
- tomography, synchrotron radiation, Materials characterization and modelling, Materials research, grain boundaries, data acquisition, X-ray diffraction