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A complete antenna pattern characterization procedure for spherical near-field antenna measurements employing a high-order probe and a full probe correction is described. The procedure allows an (almost) arbitrary antenna to be used as a probe. Different measurement steps of the procedure and the associated data processing are described in detail, and comparison to the existing procedure employing a first-order probe is made. The procedure is validated through measurements.
Original languageEnglish
JournalI E E E Transactions on Antennas and Propagation
Publication date2010
Volume58
Issue8
Pages2623-2631
ISSN0018-926X
DOIs
StatePublished

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CitationsWeb of Science® Times Cited: 8

Keywords

  • high-order probe, antenna measurements, near-field scanning
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