Subsurface excitations in a metal

Research output: Research - peer-reviewJournal article – Annual report year: 2009

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We investigate internal hot carrier excitations in a Au thin film bombarded by hyperthermal and low energy alkali and noble gas ions. Excitations within the thin film of a metal-oxide-semiconductor device are measured revealing that ions whose velocities fall below the classical threshold given by the free-electron model of a metal still excite hot carriers. Excellent agreement between these results and a nonadiabatic model that accounts for the time-varying ion-surface interaction indicates that the measured excitations are due to semilocalized electrons near the metal surface.
Original languageEnglish
JournalPhysical Review B Condensed Matter
Volume80
Issue number16
Pages (from-to)161405
ISSN0163-1829
DOIs
StatePublished - 2009

Bibliographical note

Copyright 2009 American Physical Society

CitationsWeb of Science® Times Cited: 5

    Research areas

  • ION-BEAMS, CLEAN POLYCRYSTALLINE GOLD, SOLIDS, ENERGY, SURFACES, KINETIC ELECTRON-EMISSION
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