Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor

Publication: Research - peer-reviewConference article – Annual report year: 2012

  • Author: Evangelista, Y.

  • Author: Campana, R.

  • Author: Del Monte, E.

  • Author: Donnarumma, I.

  • Author: Feroci, M.

  • Author: Muleri, F.

  • Author: Pacciani, L.

  • Author: Soffitta, P.

  • Author: Rachevski, A.

  • Author: Vacchi, A.

  • Author: Zampa, G.

  • Author: Zampa, N.

  • Author: Suchy, S.

  • Author: Brandt, Søren

    Astrophysics, National Space Institute, Technical University of Denmark, Elektrovej, 2800, Kgs. Lyngby, Denmark

  • Author: Hernanz, M.

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The Large Observatory For X-ray Timing (LOFT), selected by ESA as one of the four Cosmic Vision M3 candidate missions to undergo an assessment phase, will revolutionize the study of compact objects in our galaxy and of the brightest supermassive black holes in active galactic nuclei. The Large Area Detector (LAD), carrying an unprecedented effective area of 10 m^2, is complemented by a coded-mask Wide Field Monitor, in charge of monitoring a large fraction of the sky potentially accessible to the LAD, to provide the history and context for the sources observed by LAD and to trigger its observations on their most interesting and extreme states. In this paper we present detailed simulations of the imaging capabilities of the Silicon Drift Detectors developed for the LOFT Wide Field Monitor detection plane. The simulations explore a large parameter space for both the detector design and the environmental conditions, allowing us to optimize the detector characteristics and demonstrating the X-ray imaging performance of the large-area SDDs in the 2-50 keV energy band.
Original languageEnglish
JournalProceedings of S P I E - International Society for Optical Engineering
Publication date2012
Volume8443
Journal numberPART 3
Pages84435P
Number of pages10
ISSN0277-786X
DOIs
StatePublished

Conference

ConferenceSpace Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
Number8443
CountryNetherlands
CityAmsterdam
Period01/07/1206/07/12
CitationsWeb of Science® Times Cited: 0

Keywords

  • LOFT wide field monitor, Silicon drift detectors, SDD, Simulations, Spatial resolution

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