Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2010

Standard

Silicon based ultrafast optical waveform sampling : [Best Student Paper Award]. / Ji, Hua; Galili, Michael; Pu, Minhao; Oxenløwe, Leif Katsuo; Jeppesen, Palle.

Proceedings of SPIE. Vol. 7728 SPIE - International Society for Optical Engineering, 2010. 772807 (Proceedings of SPIE, the International Society for Optical Engineering).

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2010

Harvard

Ji, H, Galili, M, Pu, M, Oxenløwe, LK & Jeppesen, P 2010, Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]. in Proceedings of SPIE. vol. 7728, 772807, SPIE - International Society for Optical Engineering. Proceedings of SPIE, the International Society for Optical Engineering, DOI: 10.1117/12.854110

APA

Ji, H., Galili, M., Pu, M., Oxenløwe, L. K., & Jeppesen, P. (2010). Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]. In Proceedings of SPIE. (Vol. 7728). [772807] SPIE - International Society for Optical Engineering. (Proceedings of SPIE, the International Society for Optical Engineering). DOI: 10.1117/12.854110

CBE

Ji H, Galili M, Pu M, Oxenløwe LK, Jeppesen P. 2010. Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]. In Proceedings of SPIE. SPIE - International Society for Optical Engineering. (Proceedings of SPIE, the International Society for Optical Engineering). Available from: 10.1117/12.854110

MLA

Ji, Hua et al. "Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]". Proceedings of SPIE. SPIE - International Society for Optical Engineering. 2010. (Proceedings of SPIE, the International Society for Optical Engineering). Available: 10.1117/12.854110

Vancouver

Ji H, Galili M, Pu M, Oxenløwe LK, Jeppesen P. Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]. In Proceedings of SPIE. Vol. 7728. SPIE - International Society for Optical Engineering. 2010. 772807. (Proceedings of SPIE, the International Society for Optical Engineering). Available from, DOI: 10.1117/12.854110

Author

Ji, Hua; Galili, Michael; Pu, Minhao; Oxenløwe, Leif Katsuo; Jeppesen, Palle / Silicon based ultrafast optical waveform sampling : [Best Student Paper Award].

Proceedings of SPIE. Vol. 7728 SPIE - International Society for Optical Engineering, 2010. 772807 (Proceedings of SPIE, the International Society for Optical Engineering).

Publication: Research - peer-reviewArticle in proceedings – Annual report year: 2010

Bibtex

@inbook{e6da199013024fe587b44398e08d5ac3,
title = "Silicon based ultrafast optical waveform sampling: [Best Student Paper Award]",
keywords = "non-linearity, silicon nanowire, optical communiation, optical sampling",
author = "Hua Ji and Michael Galili and Minhao Pu and Oxenløwe, {Leif Katsuo} and Palle Jeppesen",
note = "Best student paper",
year = "2010",
doi = "10.1117/12.854110",
volume = "7728",
booktitle = "Proceedings of SPIE",
publisher = "SPIE - International Society for Optical Engineering",

}

RIS

TY - GEN

T1 - Silicon based ultrafast optical waveform sampling

T2 - [Best Student Paper Award]

AU - Ji,Hua

AU - Galili,Michael

AU - Pu,Minhao

AU - Oxenløwe,Leif Katsuo

AU - Jeppesen,Palle

N1 - Best student paper

PY - 2010

Y1 - 2010

N2 - A 300 nmx450 nmx5 mm silicon nanowire is designed and fabricated for a four wave mixing based non-linear optical gate. Based on this silicon nanowire, an ultra-fast optical sampling system is successfully demonstrated using a free-running fiber laser with a carbon nanotube-based mode-locker as the sampling source. A clear eye-diagram of a 320 Gbit/s data signal is obtained. The temporal resolution of the sampling system is estimated to 360 fs.

AB - A 300 nmx450 nmx5 mm silicon nanowire is designed and fabricated for a four wave mixing based non-linear optical gate. Based on this silicon nanowire, an ultra-fast optical sampling system is successfully demonstrated using a free-running fiber laser with a carbon nanotube-based mode-locker as the sampling source. A clear eye-diagram of a 320 Gbit/s data signal is obtained. The temporal resolution of the sampling system is estimated to 360 fs.

KW - non-linearity

KW - silicon nanowire

KW - optical communiation

KW - optical sampling

U2 - 10.1117/12.854110

DO - 10.1117/12.854110

M3 - Article in proceedings

VL - 7728

BT - Proceedings of SPIE

PB - SPIE - International Society for Optical Engineering

ER -