Scanning Probe Microscopy at 650 °C in Air

Publication: Research - peer-reviewJournal article – Annual report year: 2009

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The controlled atmosphere high temperature scanning probe microscope was designed to study the electrical properties of surfaces at elevated temperatures by using the probe as an electrode. The capability of a simultaneous acquisition of topographical and electrical data for the same surface area at 650°C is demonstrated on several samples.
Original languageEnglish
JournalElectrochemical and Solid-State Letters
Publication date2009
Volume12
Issue10
PagesB144-B145
ISSN1099-0062
DOIs
StatePublished

Bibliographical note

Copyright The Electrochemical Society, Inc. [2009]. All rights reserved. Except as provided under U.S. copyright law, this work may not be reproduced, resold, distributed, or modified without the express permission of The Electrochemical Society (ECS).

CitationsWeb of Science® Times Cited: 8

Keywords

  • Solid Oxide Fuel Cells, Fuel Cells and hydrogen
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