The recrystallization kinetics of nanostructured copper samples processed by dynamic plastic deformation was investigated by electron backscatter diffraction. It was found that the evolution of the recrystallized volume fraction as a function of annealing time has a very low slope (n=0.37) when plotted as an Avrami plot. Various reasons for such a low slope are discussed, including possible recrystallization during storage of samples, and the heterogeneous recrystallization kinetics. The effects of heterogeneous recrystallization kinetics are illustrated by a simplified model with a fast and a slowly recrystallizing region.