Quantized conductance in an atom-sized point contact

Publication: Research - peer-reviewJournal article – Annual report year: 1994

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Quantized conductance in an atom-sized point contact. / Olesen, L.; Laegsgaard, E.; Stensgaard, I.; Besenbacher, Flemming; Schiøtz, Jakob; Stoltze, Per; Jacobsen, Karsten Wedel; Nørskov, Jens Kehlet.

In: Physical Review Letters, Vol. 72, No. 14, 1994, p. 2251-2254.

Publication: Research - peer-reviewJournal article – Annual report year: 1994

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Author

Olesen, L.; Laegsgaard, E.; Stensgaard, I.; Besenbacher, Flemming; Schiøtz, Jakob; Stoltze, Per; Jacobsen, Karsten Wedel; Nørskov, Jens Kehlet / Quantized conductance in an atom-sized point contact.

In: Physical Review Letters, Vol. 72, No. 14, 1994, p. 2251-2254.

Publication: Research - peer-reviewJournal article – Annual report year: 1994

Bibtex

@article{ecf6cfe4133440019bfca86a29ccd243,
title = "Quantized conductance in an atom-sized point contact",
keywords = "TRANSPORT, RESISTANCE",
publisher = "American Physical Society",
author = "L. Olesen and E. Laegsgaard and I. Stensgaard and Flemming Besenbacher and Jakob Schiøtz and Per Stoltze and Jacobsen, {Karsten Wedel} and Nørskov, {Jens Kehlet}",
note = "Copyright (1994) by the American Physical Society.",
year = "1994",
doi = "10.1103/PhysRevLett.72.2251",
volume = "72",
number = "14",
pages = "2251--2254",
journal = "Physical Review Letters",
issn = "0031-9007",

}

RIS

TY - JOUR

T1 - Quantized conductance in an atom-sized point contact

A1 - Olesen,L.

A1 - Laegsgaard,E.

A1 - Stensgaard,I.

A1 - Besenbacher,Flemming

A1 - Schiøtz,Jakob

A1 - Stoltze,Per

A1 - Jacobsen,Karsten Wedel

A1 - Nørskov,Jens Kehlet

AU - Olesen,L.

AU - Laegsgaard,E.

AU - Stensgaard,I.

AU - Besenbacher,Flemming

AU - Schiøtz,Jakob

AU - Stoltze,Per

AU - Jacobsen,Karsten Wedel

AU - Nørskov,Jens Kehlet

PB - American Physical Society

PY - 1994

Y1 - 1994

N2 - We present direct measurements at room temperature of the conductance of a point contact between a scanning tunneling microscope tip and Ni, Cu, and Pt surfaces. As the contact is stretched the conductance jumps in units of 2e2/h. Atomistic simulations of the stretch of the contact combined with calculations of the conductance using the Landauer formula show that the observed behavior is due to the quantization of the transverse electron motion in a contact which contains between one and ten atoms.

AB - We present direct measurements at room temperature of the conductance of a point contact between a scanning tunneling microscope tip and Ni, Cu, and Pt surfaces. As the contact is stretched the conductance jumps in units of 2e2/h. Atomistic simulations of the stretch of the contact combined with calculations of the conductance using the Landauer formula show that the observed behavior is due to the quantization of the transverse electron motion in a contact which contains between one and ten atoms.

KW - TRANSPORT

KW - RESISTANCE

UR - http://link.aps.org/doi/10.1103/PhysRevLett.72.2251

U2 - 10.1103/PhysRevLett.72.2251

DO - 10.1103/PhysRevLett.72.2251

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 14

VL - 72

SP - 2251

EP - 2254

ER -