Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips

Publication: Research - peer-reviewJournal article – Annual report year: 2012

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Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips. / Meinander, Kristoffer; Jensen, Thomas N.; Simonsen, Soren B.; Helveg, Stig; Lauritsen, Jeppe Vang.

In: Nanotechnology, Vol. 23, No. 40, 2012, p. -.

Publication: Research - peer-reviewJournal article – Annual report year: 2012

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Author

Meinander, Kristoffer; Jensen, Thomas N.; Simonsen, Soren B.; Helveg, Stig; Lauritsen, Jeppe Vang / Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips.

In: Nanotechnology, Vol. 23, No. 40, 2012, p. -.

Publication: Research - peer-reviewJournal article – Annual report year: 2012

Bibtex

@article{184fa42a92574fdfb184839e61de226e,
title = "Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips",
publisher = "Institute of Physics Publishing",
author = "Kristoffer Meinander and Jensen, {Thomas N.} and Simonsen, {Soren B.} and Stig Helveg and Lauritsen, {Jeppe Vang}",
year = "2012",
doi = "10.1088/0957-4484/23/40/405705",
volume = "23",
number = "40",
pages = "--",
journal = "Nanotechnology",
issn = "0957-4484",

}

RIS

TY - JOUR

T1 - Quantification of tip-broadening in non-contact atomic force microscopy with carbon nanotube tips

A1 - Meinander,Kristoffer

A1 - Jensen,Thomas N.

A1 - Simonsen,Soren B.

A1 - Helveg,Stig

A1 - Lauritsen,Jeppe Vang

AU - Meinander,Kristoffer

AU - Jensen,Thomas N.

AU - Simonsen,Soren B.

AU - Helveg,Stig

AU - Lauritsen,Jeppe Vang

PB - Institute of Physics Publishing

PY - 2012

Y1 - 2012

N2 - Carbon nanotube terminated atomic force microscopy (AFM) probes have been used for the imaging of 5 nm wide surface supported Pt nanoclusters by non-contact (dynamic mode) AFM in an ultra-high vacuum. The results are compared to AFM measurements done with conventional Si-tips, as well as with transmission electron microscopy images, which give accurate measures for cluster widths. Despite their ideal aspect ratio, tip-broadening is concluded to be a severe problem even when imaging with carbon nanotube tips, which overestimates the cluster width by several times the nominal width of the nanotube tip. This broadening is attributed to a bending of the carbon nanotubes, and not to pure geometrical factors, which coincidentally results in a significant improvement for relative height measurements of tightly spaced high aspect ratio structures, as compared to what can be achieved with geometrically limited conventional probes. Superior durability also stands out as a defining feature of carbon nanotube terminated probes, allowing them to give results with a greatly enhanced reproducibility.

AB - Carbon nanotube terminated atomic force microscopy (AFM) probes have been used for the imaging of 5 nm wide surface supported Pt nanoclusters by non-contact (dynamic mode) AFM in an ultra-high vacuum. The results are compared to AFM measurements done with conventional Si-tips, as well as with transmission electron microscopy images, which give accurate measures for cluster widths. Despite their ideal aspect ratio, tip-broadening is concluded to be a severe problem even when imaging with carbon nanotube tips, which overestimates the cluster width by several times the nominal width of the nanotube tip. This broadening is attributed to a bending of the carbon nanotubes, and not to pure geometrical factors, which coincidentally results in a significant improvement for relative height measurements of tightly spaced high aspect ratio structures, as compared to what can be achieved with geometrically limited conventional probes. Superior durability also stands out as a defining feature of carbon nanotube terminated probes, allowing them to give results with a greatly enhanced reproducibility.

U2 - 10.1088/0957-4484/23/40/405705

DO - 10.1088/0957-4484/23/40/405705

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 40

VL - 23

SP - -

ER -