Optical Waveform Sampling and Error-Free Demultiplexing of 1.28 Tb/s Serial Data in a Nanoengineered Silicon Waveguide

Publication: Research - peer-reviewJournal article – Annual report year: 2011

View graph of relations

This paper presents the experimental demonstrations of using a pure nanoengineered silicon waveguide for 1.28 Tb/s serial data optical waveform sampling and 1.28 Tb/s–10 Gb/s error free demultiplexing. The 330-fs pulses are resolved in each 780-fs time slot in waveform sampling. Error-free operation is achieved in the 1.28 Tb/s–10 Gb/s demultiplexing.
Original languageEnglish
JournalJournal of Lightwave Technology
Publication date2011
Volume29
Journal number4
Pages426-431
ISSN0733-8724
DOIs
StatePublished
CitationsWeb of Science® Times Cited: 29
Download as:
Download as PDF
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
PDF
Download as HTML
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
HTML
Download as Word
Select render style:
APAAuthorCBEHarvardMLAStandardVancouverShortLong
Word

ID: 5506370