## Modeling the hysteresis of a scanning probe microscope

Publication: Research - peer-review › Journal article – Annual report year: 2000

### Standard

**Modeling the hysteresis of a scanning probe microscope.** / Dirscherl, Kai; Garnæs, Jørgen; Nielsen, L.; Jørgensen, J. F.; Sørensen, Mads Peter.

Publication: Research - peer-review › Journal article – Annual report year: 2000

### Harvard

*Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures*, vol 18, no. 2, pp. 621-625. DOI: 10.1116/1.591249

### APA

*Modeling the hysteresis of a scanning probe microscope*.

*Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures*,

*18*(2), 621-625. DOI: 10.1116/1.591249

### CBE

### MLA

*Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures*. 2000, 18(2). 621-625. Available: 10.1116/1.591249

### Vancouver

### Author

### Bibtex

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### RIS

TY - JOUR

T1 - Modeling the hysteresis of a scanning probe microscope

AU - Dirscherl,Kai

AU - Garnæs,Jørgen

AU - Nielsen,L.

AU - Jørgensen,J. F.

AU - Sørensen,Mads Peter

PY - 2000

Y1 - 2000

N2 - Most scanning probe microscopes use piezoelectric actuators in open loop configurations. Therefore a major problem related to these instruments is the image distortion due to the hysteresis effect of the piezo. In order to eliminate the distortions, cost effective software control based on a model for hysteresis can be applied to the scanner. We describe a new rate-independent model for the hysteresis of a piezo scanner. Two reference standards were used to determine the accuracy of the model; a one-dimensional grating with a period of 3.0 mum and a two-dimensional grating with 200 nm pitch. The structures were scanned for different scan ranges varying from 5 V peak to peak to 440 V peak to peak, so that 99% of the scanners' full motion range was covered. A least-squares fit of the experiments to the hysteresis model provided standard deviations per scan range of around 0.2%. This represents an uncertainty of 1 pixel. Since our model is based on a differential equation, it is flexible even to simulate arbitrary experimental conditions such as a sudden change in the offset

AB - Most scanning probe microscopes use piezoelectric actuators in open loop configurations. Therefore a major problem related to these instruments is the image distortion due to the hysteresis effect of the piezo. In order to eliminate the distortions, cost effective software control based on a model for hysteresis can be applied to the scanner. We describe a new rate-independent model for the hysteresis of a piezo scanner. Two reference standards were used to determine the accuracy of the model; a one-dimensional grating with a period of 3.0 mum and a two-dimensional grating with 200 nm pitch. The structures were scanned for different scan ranges varying from 5 V peak to peak to 440 V peak to peak, so that 99% of the scanners' full motion range was covered. A least-squares fit of the experiments to the hysteresis model provided standard deviations per scan range of around 0.2%. This represents an uncertainty of 1 pixel. Since our model is based on a differential equation, it is flexible even to simulate arbitrary experimental conditions such as a sudden change in the offset

U2 - 10.1116/1.591249

DO - 10.1116/1.591249

M3 - Journal article

VL - 18

SP - 621

EP - 625

JO - Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

T2 - Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

JF - Journal of Vacuum Science and Technology. Part B. Microelectronics and Nanometer Structures

SN - 1071-1023

IS - 2

ER -