Microstructure degradation of LSM-YSZ cathode in SOFCs operated at various conditions
Publication: Research - peer-review › Journal article – Annual report year: 2011
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Microstructure degradation of LSM-YSZ cathode in SOFCs operated at various conditions. / Liu, Yi-Lin; Thydén, Karl Tor Sune; Chen, Ming; Hagen, Anke.
In: Solid State Ionics, Vol. 206, 2012, p. 97-103.Publication: Research - peer-review › Journal article – Annual report year: 2011
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TY - JOUR
T1 - Microstructure degradation of LSM-YSZ cathode in SOFCs operated at various conditions
AU - Liu,Yi-Lin
AU - Thydén,Karl Tor Sune
AU - Chen,Ming
AU - Hagen,Anke
PY - 2012
Y1 - 2012
N2 - Systematic microstructural analyses have been carried out on a series of technological SOFCs that went through long-term cell tests with various operating parameters including temperature, current load and time length under current. For the LSM-YSZ cathode, a number of microstructure degradation mechanisms have been identified. And it has been observed that different mechanisms dominate the degradation process under different test conditions. The severe cathode degradation at 750 °C operation with high current density is attributed to a loss of the cathode/electrolyte interface stability. For the cells tested at 850 °C, the interface stability is maintained due to further sintering during cell operation. A cell test lasting for 2 years (17500 h) at 850 °C with a moderate current density (not greater than 1 A/cm2) has shown that the cathode microstructure is fairly robust to the degradation processes at this temperature, such as grain coarsening and element diffusion. The cell degrades mildly with a cell voltage degradation rate of 7 mV/1000 h.
AB - Systematic microstructural analyses have been carried out on a series of technological SOFCs that went through long-term cell tests with various operating parameters including temperature, current load and time length under current. For the LSM-YSZ cathode, a number of microstructure degradation mechanisms have been identified. And it has been observed that different mechanisms dominate the degradation process under different test conditions. The severe cathode degradation at 750 °C operation with high current density is attributed to a loss of the cathode/electrolyte interface stability. For the cells tested at 850 °C, the interface stability is maintained due to further sintering during cell operation. A cell test lasting for 2 years (17500 h) at 850 °C with a moderate current density (not greater than 1 A/cm2) has shown that the cathode microstructure is fairly robust to the degradation processes at this temperature, such as grain coarsening and element diffusion. The cell degrades mildly with a cell voltage degradation rate of 7 mV/1000 h.
KW - Interface
KW - Solid Oxide Fuel Cells
KW - Degradation
KW - Long-term stability
KW - SEM
KW - LSM-YSZ cathode
KW - Microstructure
U2 - 10.1016/j.ssi.2011.10.020
DO - 10.1016/j.ssi.2011.10.020
M3 - Journal article
VL - 206
SP - 97
EP - 103
JO - Solid State Ionics
T2 - Solid State Ionics
JF - Solid State Ionics
SN - 0167-2738
ER -