Standard

Harvard

APA

CBE

MLA

Vancouver

Author

Bibtex

@article{1bdc18bb783541c2bb0a9c40a31fb0a8,
title = "In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method",
keywords = "Synchrotron radiation radiation, thin films, epitaxial growth, crystallization, Chemical solution deposition",
publisher = "Elsevier BV",
author = "Zhao Yue and Jean-Claude Grivel and Dong He and Pallewatta, {P. G. Asanka Pramod} and Abrahamsen, {Asger Bech} and J. Bednarcik and Zimmermann, {M. v}",
year = "2012",
doi = "10.1016/j.phpro.2012.06.073",
volume = "36",
pages = "497--502",
journal = "Physics Procedia",
issn = "1875-3892",

}

RIS

TY - CONF

T1 - In-Situ Synchrotron X-ray Study of the Phase and Texture Evolution of Ceria and Superconductor Films Deposited by Chemical Solution Method

A1 - Yue,Zhao

A1 - Grivel,Jean-Claude

A1 - He,Dong

A1 - Pallewatta,P. G. Asanka Pramod

A1 - Abrahamsen,Asger Bech

A1 - Bednarcik,J.

A1 - Zimmermann,M. v

AU - Yue,Zhao

AU - Grivel,Jean-Claude

AU - He,Dong

AU - Pallewatta,P. G. Asanka Pramod

AU - Abrahamsen,Asger Bech

AU - Bednarcik,J.

AU - Zimmermann,M. v

PB - Elsevier BV

PY - 2012

Y1 - 2012

N2 - In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.

AB - In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.

KW - Synchrotron radiation radiation

KW - thin films

KW - epitaxial growth

KW - crystallization

KW - Chemical solution deposition

U2 - 10.1016/j.phpro.2012.06.073

DO - 10.1016/j.phpro.2012.06.073

JO - Physics Procedia

JF - Physics Procedia

SN - 1875-3892

VL - 36

SP - 497

EP - 502

ER -