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In situ synchrotron x-ray diffraction is used to study the phase and texture formation of ceria based films and superconductor films deposited by the chemical solution method on technical substrates. Combined analysis using in situ synchrotron x-ray diffraction, thermogravimetry/differential thermal analysis and Fourier transform infra-red (FTIR) spectroscopy allows to study the details on the decomposition and crystallization processes of ceria based in form of bulk and film. The success of this work demonstrates the possibility of studying chemical reaction pathway and texture evolution of oxides starting from solution precursors using non destructive method.
Original languageEnglish
JournalPhysics Procedia
Publication date2012
Volume36
Pages497-502
ISSN1875-3892
DOIs
StatePublished

Conference

ConferenceSuperconductivity Centennial Conference (SCC-2011)
CountryNetherlands
CityThe Hague
Period18/09/1123/09/11
CitationsWeb of Science® Times Cited: 1

Keywords

  • Synchrotron radiation radiation, thin films, epitaxial growth, crystallization, Chemical solution deposition
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