Influence of Polarization of the Incident Beam on Integrated Intensities in X-Ray Energy-Dispersive Diffractometry

Publication: Research - peer-reviewJournal article – Annual report year: 1978

  • Author: Olsen, J. Staun

  • Author: Buras, B.

  • Author: Jensen, T.

  • Author: Alstrup, O.

  • Author: Gerward, L.

  • Author: Selsmark, B.

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Polarization measurements of the primary X-ray beam produced by thick copper and tungsten anodes are reported and formulas derived for integrated intensities of Bragg reflections in energy-dispersive diffractometry with the polarization of the primary beam taken into account. It was found that for an angle of 45° between the scattering plane and the plane containing the electron beam and the primary beam, the influence of polarization vanishes, while it increases as the angle changes from 45° to either 0 or 90°. For the latter values, the influence of polarization is considerable at high photon energies and at scattering angles close to 90
Original languageEnglish
JournalActa Crystallographica. Section A: Foundations of Crystallography
Publication date1978
Volume34
IssueJAN
Pages84-87
ISSN0108-7673
StatePublished
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