High Resolution Orientation Distribution Function

Publication: Research - peer-reviewConference article – Annual report year: 2011

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A new method for reconstructing a High Resolution Orientation Distribution Function (HRODF) from X-ray diffraction data is presented. It is shown that the method is capable of accommodating very localized features, e.g. sharp peaks from recrystallized grains on a background of a texture component from the deformed material. The underlying mathematical formalism supports all crystallographic space groups and reduces the problem to solving a (large) set of linear equations. An implementation on multi-core CPUs and Graphical Processing Units (GPUs) is discussed along with an example on simulated data.
Original languageEnglish
JournalMaterials Science Forum
Publication date2012
Volume702-703
Pages536-539
ISSN0255-5476
DOIs
StatePublished

Conference

Conference16th International Conference on Textures of Materials
Number16
CountryIndia
CityMumbai
Period12/12/1117/12/11
CitationsWeb of Science® Times Cited: 1

Keywords

  • ODF, inverse problems, High resolution, x-ray
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