Publication: Research - peer-review › Conference article – Annual report year: 2011
A new method for reconstructing a High Resolution Orientation Distribution Function (HRODF) from X-ray diffraction data is presented. It is shown that the method is capable of accommodating very localized features, e.g. sharp peaks from recrystallized grains on a background of a texture component from the deformed material. The underlying mathematical formalism supports all crystallographic space groups and reduces the problem to solving a (large) set of linear equations. An implementation on multi-core CPUs and Graphical Processing Units (GPUs) is discussed along with an example on simulated data.
|Journal||Materials Science Forum|
|State||Published - 2012|
|Event||16th International Conference on Textures of Materials - Mumbai, India|
|Conference||16th International Conference on Textures of Materials|
|Period||12/12/2011 → 17/12/2011|
|Citations||Error in DOI please contact email@example.com|
- ODF, inverse problems, High resolution, x-ray
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